Rutgers ORA

Office of Research and Economic Development (ORED)

Microsopy

Department : Institute for Advanced Materials, Devices and Nanotechnology (IAMDN)

Field Emission TEM/STEM, (JEOL 2010F)

  • Acceleration voltage 20-200kV with ZrO-W field emission source
  • Scanning Transmission Electron Microscopy (STEM) interface
  • Digital imaging with 1Kx1K CCD camera
  • BF/DF STEM detectors
  • HADF STEM detector
  • Electron Energy Loss (EELS) spectrometer
  • 2Kx2K GATAN imaging EELS filter (GIF)
  • Heating (1400K) and cooling (90K) holders
  • Electron biprism for holography imaging of magnetic and electrical fields
Department : Center for Structured Particulate Organic Systems (CSOPS)

Particle Vision and Measurement (PVM®) provides the ability to see particles and droplets as they naturally exist in a crystallizer, vessel or pipeline. With rapid capture, saving, and analysis of microscope-quality images at full process concentration, the PVM® facilitates detailed understanding of complex particle systems faster than any other method.

Department : Rutgers Institute for Advanced Materials, Devices and Nanotechnology (IAMDN)

For more information regarding the Renishaw inVia Raman Microscope with 514, 635 & 785 nm lasers please see the Rutgers Institute for Advanced Materials, Devices and Nanotechnology (IAMDN) facilities website: http://iamdn.rutgers.edu/facilities

Department : Rutgers Institute for Advanced Materials, Devices and Nanotechnology (IAMDN) Material Science & Engineering

There is more information at the Rutgers Institute for Advanced Materials, Devices and Nanotechnology (IAMDN) facilities website: http://iamdn.rutgers.edu/facilities or http://mse.rutgers.edu/facilities regarding the Zeiss Sigma Field Emission SEM with Oxford INCA PentaFETx3 EDS system (Model 8100) with fully digital image collection, t

Department : Rutgers Institute for Advanced Materials, Devices and Nanotechnology (IAMDN)
  • Acceleration voltage 20-200kV with Lab6 electron source
  • High resolution lattice imaging (HRTEM) and diffraction
  • Nano-probe diffraction and convergent beam electron diffraction (CBED) analysis
  • Chemical analysis and mapping with X-Ray energy dispersive spectroscopy (EDS)
  • Chemical analysis with electron energy loss spectroscopy (EELS)
  • Image simulation and diffraction analysis